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Page 157of 201nollogy Aicte Mandatory DisclosureN, GCMs, SPM-Characterization and analysis of samplesN, GCMs, SPM-Characterization and analysis of samplesN, GCMs, SPM-Characterization and analysis of samplesSM-Analysis of the samples GCMS, SPM, SC-XRD-Testing and analysis of samples GCMS, SPM, SC-XRD-Testing and analysis of samples GCMS, SPM, SC-XRD GCMS, SPM, SC-XRD-Testing and analysis of samplesSM-Analysis of the samples GCMS, SPM, SC-XRD-Analysis of the samples GCMS, SPM, SC-XRD-Analysis of the samplesSM-Analysis of the samplesand diffraction meassurements and analysisn determination and elemental mappingD studies of inorganic materialsller (BET) surface area analysiss Using BET for battery electrode materialss materialssing BET sing BET s materialsion analysis of metal oxide samplesand diffraction meassurements and analysisstudies and compositional studies of nanomaterialsasurements and analysismaging and elemental mapping of nanomaterialss Using BET for battery electrode materialsing measurementsusing Zetasizerfilms and cross section imagingfilms and cross section imagingmaging and elemental mapping of nanomaterialsrptnalysis of Nanoparticlesion analysis of metal oxide samples